PRICES include / exclude VAT
3587 Semiconductor elements
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
CSN EN 60191-3
Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
Released: 01.09.2000
English Hardcopy
In stock
37.00 EUR
CSN EN 60749-31
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 01.12.2004
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 01.12.2004
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
84.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN 62132-8
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Released: 01.04.2013
English Hardcopy
In stock
69.00 EUR
CSN EN 61747-2-1 ed. 2
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Released: 01.11.2013
English Hardcopy
In stock
61.00 EUR
CSN EN 62435-5
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Released: 01.09.2017
English Hardcopy
In stock
69.00 EUR
CSN EN 62433-2 ed. 2
EMC IC Modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EMC IC Modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Released: 01.09.2017
English Hardcopy
In stock
130.00 EUR
CSN EN 60749-6 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Released: 01.12.2010
English Hardcopy
In stock
52.00 EUR