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CSN EN 62779-1
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Released: 01.10.2016
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62435-8
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Released: 01.03.2021
English Hardcopy
In stock
61.00 EUR
CSN EN 61988-2-1 ed. 2
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Released: 01.08.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 62047-19
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Released: 01.04.2014
English Hardcopy
In stock
84.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 63244-1
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Released: 01.05.2022
English Hardcopy
In stock
84.00 EUR
CSN EN 62415
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Released: 01.12.2010
English Hardcopy
In stock
52.00 EUR
CSN EN 62047-8
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Released: 01.12.2011
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-21 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Released: 01.12.2011
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-7
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Released: 01.02.2012
English Hardcopy
In stock
69.00 EUR
CSN EN 61747-6-2
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Released: 01.03.2012
English Hardcopy
In stock
98.00 EUR
CSN EN 62047-12
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Released: 01.04.2012
English Hardcopy
In stock
84.00 EUR