PRICES include / exclude VAT
3587 Semiconductor elements
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
CSN EN 61967-8
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.05.2012
English Hardcopy
In stock
84.00 EUR
CSN EN IEC 62228-7
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Released: 01.10.2022
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 60749-10 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Released: 01.01.2023
English Hardcopy
In stock
61.00 EUR
CSN IEC 62047-28
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN IEC 62830-2
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-9 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Released: 01.12.2017
English Hardcopy
In stock
92.00 EUR
CSN IEC 62880-1
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Released: 01.06.2018
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 61967-8 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-2
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Released: 01.05.2007
English Hardcopy
In stock
69.00 EUR
CSN EN 62258-6
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
Released: 01.06.2007
English Hardcopy
In stock
52.00 EUR
CSN EN 60191-6-16
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Released: 01.01.2008
English Hardcopy
In stock
52.00 EUR