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CSN EN 61964
Integrated circuits - Memory devices pin configurations
Integrated circuits - Memory devices pin configurations
Released: 01.06.2000
English Hardcopy
In stock
92.00 EUR
CSN EN 60749-8
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Released: 01.12.2003
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
84.00 EUR
CSN EN 61967-2
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Released: 01.04.2006
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 62228-6
Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
Released: 01.06.2023
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 62228-1
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Released: 01.08.2018
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62228-3
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Released: 01.11.2019
English Hardcopy
In stock
106.00 EUR
CSN EN IEC 60749-17 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Released: 01.11.2019
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62435-3
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Released: 01.09.2020
English Hardcopy
In stock
61.00 EUR
CSN EN 61747-30-1
Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
Released: 01.03.2013
English Hardcopy
In stock
92.00 EUR
CSN EN 62047-18
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Released: 01.04.2014
English Hardcopy
In stock
61.00 EUR
CSN EN 62215-3
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Released: 01.04.2014
English Hardcopy
In stock
84.00 EUR