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CSN EN 62047-13
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
Released: 01.10.2012
English Hardcopy
In stock
61.00 EUR
CSN EN 62132-8
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Released: 01.04.2013
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62433-1
EMC IC modelling - Part 1: General modelling framework
EMC IC modelling - Part 1: General modelling framework
Released: 01.11.2019
English Hardcopy
In stock
106.00 EUR
CSN EN IEC 60749-18 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Released: 01.12.2019
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60749-12 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Released: 01.08.2018
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62435-4
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Released: 01.01.2019
English Hardcopy
In stock
69.00 EUR
CSN EN 62435-5
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Released: 01.09.2017
English Hardcopy
In stock
69.00 EUR
CSN EN 62433-2 ed. 2
EMC IC Modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EMC IC Modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Released: 01.09.2017
English Hardcopy
In stock
130.00 EUR
CSN EN 60749-6 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 60747-5-5 ed. 2
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Released: 01.03.2021
English Hardcopy
In stock
98.00 EUR
CSN EN IEC 60749-15 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Released: 01.03.2021
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 60749-30 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 01.03.2021
English Hardcopy
In stock
61.00 EUR