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3587 Semiconductor elements
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CSN EN IEC 60749-30 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 01.03.2021
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Released: 01.04.2021
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62435-7
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Released: 01.07.2021
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 63373
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Released: 01.10.2022
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
92.00 EUR