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3587 Semiconductor elements
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CSN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Released: 01.04.2021
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62435-7
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Released: 01.07.2021
English Hardcopy
In stock
69.00 EUR
CSN EN 61747-2-1 ed. 2
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Released: 01.11.2013
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 63373
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Released: 01.10.2022
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
92.00 EUR