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English Hardcopy
In stock
69.00 EUR
CSN EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 01.07.2011
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-25
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Released: 01.06.2004
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 62435-2
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Released: 01.09.2017
English Hardcopy
In stock
69.00 EUR
CSN EN 62132-1 ed. 2
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Released: 01.06.2016
English Hardcopy
In stock
84.00 EUR
CSN EN 62779-2
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Released: 01.10.2016
English Hardcopy
In stock
61.00 EUR
CSN EN 62779-3
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Released: 01.12.2016
English Hardcopy
In stock
61.00 EUR
CSN EN 62433-4
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Released: 01.01.2017
English Hardcopy
In stock
130.00 EUR
CSN EN IEC 60749-13 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Released: 01.10.2018
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 60747-16-8
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Released: 01.07.2023
English Hardcopy
In stock
84.00 EUR