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CSN EN 60749-5 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.12.2017
English Hardcopy
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52.00 EUR
CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 01.02.2017
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60749-26 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Released: 01.08.2018
English Hardcopy
In stock
98.00 EUR
CSN EN IEC 60191-1 ed. 2
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Released: 01.10.2018
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 62435-6
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
Released: 01.03.2019
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 61967-1 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Released: 01.07.2019
English Hardcopy
In stock
84.00 EUR
CSN EN 62418
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Released: 01.01.2011
English Hardcopy
In stock
84.00 EUR
CSN EN 62047-4
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Released: 01.05.2011
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
84.00 EUR
CSN EN 62258-2 ed. 2
Semiconductor die products - Part 2: Exchange data formats
Semiconductor die products - Part 2: Exchange data formats
Released: 01.01.2012
English Hardcopy
In stock
106.00 EUR
CSN EN 62047-10
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Released: 01.03.2012
English Hardcopy
In stock
61.00 EUR