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CSN IEC 62830-1
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Released: 01.11.2017
English Hardcopy
In stock
69.00 EUR
CSN EN 61988-2-3
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Released: 01.04.2010
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
92.00 EUR
CSN EN 62341-5
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Released: 01.08.2010
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-6
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
Released: 01.11.2010
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 62418
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Released: 01.01.2011
English Hardcopy
In stock
84.00 EUR
CSN EN 62047-4
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Released: 01.05.2011
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
84.00 EUR
CSN EN 62258-2 ed. 2
Semiconductor die products - Part 2: Exchange data formats
Semiconductor die products - Part 2: Exchange data formats
Released: 01.01.2012
English Hardcopy
In stock
106.00 EUR
CSN EN 62047-10
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Released: 01.03.2012
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 60747-17
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Released: 01.04.2021
English Hardcopy
In stock
98.00 EUR