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CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
84.00 EUR
CSN IEC 62047-28
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN IEC 62830-2
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-9 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Released: 01.12.2017
English Hardcopy
In stock
92.00 EUR
CSN IEC 62880-1
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Released: 01.06.2018
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62435-8
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Released: 01.03.2021
English Hardcopy
In stock
61.00 EUR
CSN EN 62415
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Released: 01.12.2010
English Hardcopy
In stock
52.00 EUR
CSN EN 62047-8
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Released: 01.12.2011
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-21 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Released: 01.12.2011
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-7
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Released: 01.02.2012
English Hardcopy
In stock
69.00 EUR
CSN EN 61747-6-2
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Released: 01.03.2012
English Hardcopy
In stock
98.00 EUR