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CSN EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 01.12.2004
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 01.12.2004
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 60749-12 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Released: 01.08.2018
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62435-4
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Released: 01.01.2019
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62433-1
EMC IC modelling - Part 1: General modelling framework
EMC IC modelling - Part 1: General modelling framework
Released: 01.11.2019
English Hardcopy
In stock
106.00 EUR
CSN EN IEC 60749-18 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Released: 01.12.2019
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60747-5-5 ed. 2
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Released: 01.03.2021
English Hardcopy
In stock
98.00 EUR
CSN EN IEC 60749-15 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Released: 01.03.2021
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 60749-30 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 01.03.2021
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 63373
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Released: 01.10.2022
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
92.00 EUR
CSN EN 60747-15 ed. 2
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Released: 01.08.2012
English Hardcopy
In stock
69.00 EUR