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CSN EN 60749-19
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62228-6
Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
Released: 01.06.2023
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 62435-3
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Released: 01.09.2020
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-3 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-5 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.12.2017
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62228-1
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Released: 01.08.2018
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62228-3
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Released: 01.11.2019
English Hardcopy
In stock
106.00 EUR
CSN EN IEC 60749-17 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Released: 01.11.2019
English Hardcopy
In stock
52.00 EUR
CSN EN 62047-10
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Released: 01.03.2012
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-14
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Released: 01.10.2012
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 60747-16-5
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Released: 01.03.2014
English Hardcopy
In stock
92.00 EUR