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CSN EN 62047-12
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Released: 01.04.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 61967-8
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.05.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 62047-22
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Released: 01.04.2015
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Released: 01.04.2015
English Hardcopy
In stock
52.00 EUR
CSN EN 62047-17
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Released: 01.09.2015
English Hardcopy
In stock
69.00 EUR
CSN EN 61988-2-1 ed. 2
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Released: 01.08.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 62047-19
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Released: 01.04.2014
English Hardcopy
In stock
84.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN 62779-1
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Released: 01.10.2016
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 63244-1
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Released: 01.05.2022
English Hardcopy
In stock
84.00 EUR
CSN EN IEC 62228-7
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Released: 01.10.2022
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 60749-10 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Released: 01.01.2023
English Hardcopy
In stock
61.00 EUR