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CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
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84.00 EUR
CSN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 01.02.2017
English Hardcopy
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69.00 EUR
CSN EN 62228-2
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Released: 01.07.2017
English Hardcopy
In stock
92.00 EUR
CSN EN 62435-1
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Released: 01.09.2017
English Hardcopy
In stock
84.00 EUR
CSN EN 61988-2-3
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Released: 01.04.2010
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
92.00 EUR
CSN EN 62341-5
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Released: 01.08.2010
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-6
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
Released: 01.11.2010
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 62418
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Released: 01.01.2011
English Hardcopy
In stock
84.00 EUR
CSN EN 62047-4
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Released: 01.05.2011
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
84.00 EUR