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CSN EN IEC 61967-8 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
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67.78 USD
CSN EN 62435-5
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Released: 01.09.2017
English Hardcopy
In stock
76.67 USD
CSN EN 62433-2 ed. 2
EMC IC Modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EMC IC Modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Released: 01.09.2017
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144.44 USD
CSN EN 60749-6 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Released: 01.10.2017
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57.78 USD
CSN EN IEC 60749-12 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Released: 01.08.2018
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57.78 USD
CSN EN IEC 62435-4
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Released: 01.01.2019
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In stock
76.67 USD
CSN EN 62047-13
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
Released: 01.10.2012
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In stock
67.78 USD
CSN EN 62132-8
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Released: 01.04.2013
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In stock
76.67 USD
CSN EN 61747-2-1 ed. 2
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Released: 01.11.2013
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67.78 USD
CSN EN 61988-3-1
Plasma display panels - Part 3-1: Mechanical interface
Plasma display panels - Part 3-1: Mechanical interface
Released: 01.07.2006
English Hardcopy
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76.67 USD
English Hardcopy
In stock
76.67 USD
CSN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Released: 01.12.2010
English Hardcopy
In stock
57.78 USD