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CSN EN 62258-2 ed. 2
Semiconductor die products - Part 2: Exchange data formats
Semiconductor die products - Part 2: Exchange data formats
Released: 01.01.2012
English Hardcopy
In stock
106.00 EUR
CSN EN 62047-3
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Released: 01.05.2007
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-4 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN IEC 62830-1
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Released: 01.11.2017
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60749-26 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Released: 01.08.2018
English Hardcopy
In stock
98.00 EUR
CSN EN IEC 60191-1 ed. 2
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Released: 01.10.2018
English Hardcopy
In stock
92.00 EUR
CSN EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Released: 01.06.2004
English Hardcopy
In stock
69.00 EUR
CSN EN 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Released: 01.12.2004
English Hardcopy
In stock
61.00 EUR
CSN EN 60747-16-4
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Released: 01.05.2005
English Hardcopy
In stock
69.00 EUR
CSN EN 60747-16-10
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Released: 01.05.2005
English Hardcopy
In stock
98.00 EUR
CSN EN 61747-2-2
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification
Released: 01.06.2005
English Hardcopy
In stock
69.00 EUR