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CSN EN 62433-4
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Released: 01.01.2017
English Hardcopy
In stock
130.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 62435-2
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Released: 01.09.2017
English Hardcopy
In stock
69.00 EUR
CSN EN 61747-4 ed. 2
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Released: 01.07.2013
English Hardcopy
In stock
52.00 EUR
CSN EN 61747-10-1
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Released: 01.03.2014
English Hardcopy
In stock
61.00 EUR
CSN EN 60191-4 ed. 2
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Released: 01.06.2014
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 01.07.2011
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-7 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.02.2012
English Hardcopy
In stock
52.00 EUR
CSN EN 61988-2-5
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Released: 01.01.2013
English Hardcopy
In stock
61.00 EUR
CSN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 01.03.2007
English Hardcopy
In stock
69.00 EUR
CSN EN 62258-5
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Released: 01.06.2007
English Hardcopy
In stock
61.00 EUR