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CSN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Released: 01.04.2021
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62435-7
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Released: 01.07.2021
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Released: 01.12.2023
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 60747-16-8
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Released: 01.07.2023
English Hardcopy
In stock
84.00 EUR
English Hardcopy
In stock
52.00 EUR
CSN EN 62132-1 ed. 2
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Released: 01.06.2016
English Hardcopy
In stock
84.00 EUR
CSN EN 62779-2
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Released: 01.10.2016
English Hardcopy
In stock
61.00 EUR
CSN EN 62779-3
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Released: 01.12.2016
English Hardcopy
In stock
61.00 EUR
CSN EN 62433-4
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Released: 01.01.2017
English Hardcopy
In stock
130.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 60749-5 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.07.2024
English Hardcopy
In stock
52.00 EUR
CSN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 01.03.2007
English Hardcopy
In stock
69.00 EUR