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CSN EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Released: 01.05.2008
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-37
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.09.2008
English Hardcopy
In stock
69.00 EUR
CSN EN 62341-1-1
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Released: 01.05.2010
English Hardcopy
In stock
69.00 EUR
CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Released: 01.12.2010
English Hardcopy
In stock
52.00 EUR
CSN EN 61747-5-3
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Released: 01.12.2010
English Hardcopy
In stock
69.00 EUR
CSN EN 60749-25
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Released: 01.06.2004
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60749-13 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Released: 01.10.2018
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Released: 01.12.2023
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 61967-4 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ů/150 Ů direct coupling method
Released: 01.10.2021
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 63287-1
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Released: 01.04.2022
English Hardcopy
In stock
92.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 60747-16-8
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Released: 01.07.2023
English Hardcopy
In stock
84.00 EUR