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CSN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Released: 01.03.2007
English Hardcopy
In stock
69.00 EUR
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 01.11.2003
English Hardcopy
In stock
52.00 EUR
CSN EN 61967-5
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Released: 01.12.2003
English Hardcopy
In stock
92.00 EUR
CSN EN 60749-32
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-21
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Released: 01.04.2015
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-20
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Released: 01.04.2015
English Hardcopy
In stock
98.00 EUR
CSN EN IEC 62435-6
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
Released: 01.03.2019
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 61967-1 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Released: 01.07.2019
English Hardcopy
In stock
84.00 EUR
CSN EN IEC 60747-16-6
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Released: 01.02.2020
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62435-9
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Released: 01.04.2022
English Hardcopy
In stock
61.00 EUR