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immediate downloadReleased: 2011-07-31
DD ISO/TS 10798:2011
Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
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| Standard number: | DD ISO/TS 10798:2011 |
| Pages: | 38 |
| Released: | 2011-07-31 |
| ISBN: | 978 0 580 61380 7 |
| Status: | Standard |
DESCRIPTION
DD ISO/TS 10798:2011
This standard DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis is classified in these ICS categories:
- 07.120 Nanotechnologies
This Technical Specification establishes methods to characterize the morphology, and to identify the elemental composition of, catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.
The methods described here for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).