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in stockReleased: 1999-11
DIN 50455-2
Characterization of photoresists used in semiconductor technology - Part 2: Determination of photosensitivity of positive photoresists
Prüfung von Materialien für die Halbleitertechnologie - Verfahren zur Charakterisierung von Fotolacken - Teil 2: Bestimmung der Lichtempfindlichkeit von Positiv-Fotolacken
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43.49 EUR
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German Hardcopy
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34.86 EUR
| Status: | Standard |
| Released: | 1999-11 |
| Standard number: | DIN 50455-2 |
| Name: | Characterization of photoresists used in semiconductor technology - Part 2: Determination of photosensitivity of positive photoresists |
| Pages: | 5 |
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