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Homepage>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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94 results
First page124678Last page
UNE EN IEC 60749-10:2022
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)
Released: 2022-07-01
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66.00 EUR
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66.00 EUR
UNE EN IEC 60749-37:2022
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Española de Normalización in January of 2023.)
Released: 2023-01-01
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75.90 EUR
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75.90 EUR
UNE EN IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)
Released: 2023-06-01
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70.40 EUR
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70.40 EUR
UNE 21302-521:2004
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
Released: 2004-05-21
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147.40 EUR
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147.40 EUR
UNE EN 60749-11:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Released: 2003-05-30
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62.04 EUR
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62.04 EUR
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51.70 EUR
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51.70 EUR
UNE EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Released: 2004-06-11
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77.88 EUR
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77.88 EUR
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64.90 EUR
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64.90 EUR
UNE EN 60749-31:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 2004-03-18
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36.96 EUR
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36.96 EUR
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30.80 EUR
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30.80 EUR
UNE EN 60749-8:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Released: 2004-05-28
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81.84 EUR
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81.84 EUR
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68.20 EUR
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68.20 EUR
UNE EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (Endorsed by Asociación Española de Normalización in May of 2018.)
Released: 2018-05-01
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83.60 EUR
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83.60 EUR
UNE EN IEC 60749-18:2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Española de Normalización in July of 2019.)
Released: 2019-07-01
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75.90 EUR
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75.90 EUR
UNE EN 60191-4:2014
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Endorsed by AENOR in May of 2014.)
Released: 2014-05-01
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75.90 EUR
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75.90 EUR
UNE EN 60191-6-17:2011
Mechanical standardization of semiconductor devices - Part 6-17: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for stacked packages - Fine-pitch ball grid array and fine-pitch land grid array (P-PFBGA and P-PFLGA) (Endorsed by AENOR in September of 2011.)
Released: 2011-09-01
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77.00 EUR
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77.00 EUR
94 results
First page124678Last page