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31.080.01 Semiconductor devices in general
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83.60 EUR
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83.60 EUR
English PDF
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63.80 EUR
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63.80 EUR
English PDF
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46.20 EUR
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46.20 EUR
English PDF
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66.00 EUR
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66.00 EUR
English PDF
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81.40 EUR
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81.40 EUR
English PDF
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2.19 EUR
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2.19 EUR
UNE EN 60749-11:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Released: 2003-05-30
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60.72 EUR
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60.72 EUR
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50.60 EUR
Spanish Hardcopy
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50.60 EUR
UNE EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Released: 2004-06-11
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76.56 EUR
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76.56 EUR
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63.80 EUR
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63.80 EUR
UNE EN 60749-31:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 2004-03-18
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35.64 EUR
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35.64 EUR
Spanish PDF
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29.70 EUR
Spanish Hardcopy
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29.70 EUR
UNE EN 60749-8:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Released: 2004-05-28
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79.20 EUR
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79.20 EUR
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66.00 EUR
Spanish Hardcopy
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66.00 EUR
UNE 21302-521:2004
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
Released: 2004-05-21
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145.20 EUR
Spanish Hardcopy
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145.20 EUR
UNE EN 61975:2010
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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125.40 EUR
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125.40 EUR