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31.080.01 Semiconductor devices in general
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66.00 EUR
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In stock
66.00 EUR
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16.50 EUR
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In stock
16.50 EUR
English PDF
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74.80 EUR
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74.80 EUR
English PDF
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46.20 EUR
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In stock
46.20 EUR
English PDF
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62.70 EUR
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In stock
62.70 EUR
UNE EN 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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46.20 EUR
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46.20 EUR
UNE EN 61975:2010
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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125.40 EUR
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125.40 EUR
UNE EN 60191-3:2001
Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.
Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.
Released: 2001-01-31
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141.24 EUR
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141.24 EUR
Spanish PDF
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117.70 EUR
Spanish Hardcopy
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117.70 EUR
UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Released: 2004-06-11
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79.20 EUR
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79.20 EUR
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66.00 EUR
Spanish Hardcopy
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66.00 EUR
UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2003-11-21
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46.20 EUR
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46.20 EUR
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38.50 EUR
Spanish Hardcopy
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38.50 EUR
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
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52.80 EUR
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52.80 EUR
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44.00 EUR
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44.00 EUR
UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
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62.04 EUR
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62.04 EUR
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51.70 EUR
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51.70 EUR