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Homepage>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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95 results
First page123578Last page
UNE EN 60191-4:2014
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Endorsed by AENOR in May of 2014.)
Released: 2014-05-01
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75.90 EUR
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In stock
75.90 EUR
UNE EN 60191-6-17:2011
Mechanical standardization of semiconductor devices - Part 6-17: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for stacked packages - Fine-pitch ball grid array and fine-pitch land grid array (P-PFBGA and P-PFLGA) (Endorsed by AENOR in September of 2011.)
Released: 2011-09-01
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77.00 EUR
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77.00 EUR
UNE EN 60191-6-21:2010
Mechanical standardization of semiconductor devices -- Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP) (Endorsed by AENOR in February of 2011.)
Released: 2011-02-01
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66.00 EUR
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66.00 EUR
UNE EN 60749-27:2006/A1:2012
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Released: 2013-01-01
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16.50 EUR
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16.50 EUR
UNE EN 60749-35:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Released: 2007-01-01
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74.80 EUR
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74.80 EUR
UNE EN 60749-5:2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in August of 2017.)
Released: 2017-08-01
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46.20 EUR
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46.20 EUR
UNE EN 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
Released: 2011-12-01
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62.70 EUR
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62.70 EUR
UNE EN 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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46.20 EUR
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46.20 EUR
UNE EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (Endorsed by Asociación Española de Normalización in May of 2018.)
Released: 2018-05-01
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83.60 EUR
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83.60 EUR
UNE EN IEC 60749-18:2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Española de Normalización in July of 2019.)
Released: 2019-07-01
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75.90 EUR
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75.90 EUR
UNE EN 60191-6-10:2004
Mechanical standardization of semiconductor devices -- Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON
Released: 2004-05-28
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76.56 EUR
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76.56 EUR
Spanish PDF
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63.80 EUR
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63.80 EUR
UNE EN 60191-6-2:2003
Mechanical standardization of semiconductor devices -- Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages
Released: 2003-10-10
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75.24 EUR
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75.24 EUR
Spanish PDF
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62.70 EUR
Spanish Hardcopy
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62.70 EUR
95 results
First page123578Last page