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Homepage>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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95 results
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UNE EN 60191-6-6:2002
Mechanical standardization of semiconductor devices -- Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine pitch land grid array (FLGA).
Released: 2002-03-21
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76.56 EUR
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76.56 EUR
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63.80 EUR
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63.80 EUR
UNE EN 60191-6-8:2002
Mechanical standardization of semiconductor devices -- Part 6-8: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for glass sealed ceramic quad flatpack (G-QFP).
Released: 2002-06-28
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75.24 EUR
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75.24 EUR
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62.70 EUR
Spanish Hardcopy
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62.70 EUR
UNE EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Released: 2003-11-21
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60.72 EUR
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60.72 EUR
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50.60 EUR
Spanish Hardcopy
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50.60 EUR
UNE EN IEC 60747-5-5:2020
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Released: 2020-10-01
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105.60 EUR
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105.60 EUR
UNE EN 62007-1:2015
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (Endorsed by AENOR in August of 2015.)
Released: 2015-08-01
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81.40 EUR
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81.40 EUR
UNE EN IEC 60749-28:2022
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)
Released: 2022-05-01
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99.00 EUR
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99.00 EUR
UNE EN 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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74.80 EUR
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74.80 EUR
UNE EN 60749-39:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)
Released: 2006-11-01
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50.60 EUR
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50.60 EUR
UNE EN 60749-6:2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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41.80 EUR
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41.80 EUR
UNE EN IEC 60749-17:2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Española de Normalización in June of 2019.)
Released: 2019-06-01
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62.70 EUR
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62.70 EUR
UNE EN IEC 60749-26:2018
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
Released: 2018-05-01
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99.00 EUR
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In stock
99.00 EUR
UNE EN 62007-1:2015/A1:2022
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (Endorsed by Asociación Española de Normalización in December of 2022.)
Released: 2022-12-01
English PDF
Immediate download
30.80 EUR
English Hardcopy
In stock
30.80 EUR
95 results
First page123468Last page