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31.080.01 Semiconductor devices in general
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UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
Released: 1978-06-15
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93.50 EUR
Spanish Hardcopy
In stock
93.50 EUR
UNE EN 60749-10:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
Released: 2003-05-30
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44.88 EUR
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In stock
44.88 EUR
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37.40 EUR
Spanish Hardcopy
In stock
37.40 EUR
UNE EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Released: 2004-05-28
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64.68 EUR
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64.68 EUR
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53.90 EUR
Spanish Hardcopy
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53.90 EUR
UNE EN 60749-19:2003/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2011-01-19
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35.64 EUR
English Hardcopy
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35.64 EUR
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29.70 EUR
Spanish Hardcopy
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29.70 EUR
UNE EN 60749-22:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Released: 2004-03-26
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89.76 EUR
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89.76 EUR
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74.80 EUR
Spanish Hardcopy
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74.80 EUR
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2011-12-21
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35.64 EUR
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35.64 EUR
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29.70 EUR
Spanish Hardcopy
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29.70 EUR
UNE EN 61975:2010/A1:2017
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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71.50 EUR
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71.50 EUR
UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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62.70 EUR
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62.70 EUR
English PDF
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69.30 EUR
English Hardcopy
In stock
69.30 EUR
English PDF
Immediate download
62.70 EUR
English Hardcopy
In stock
62.70 EUR
English PDF
Immediate download
69.30 EUR
English Hardcopy
In stock
69.30 EUR
English PDF
Immediate download
69.30 EUR
English Hardcopy
In stock
69.30 EUR