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Homepage>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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94 results
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UNE EN 60749-38:2008
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
Released: 2008-09-01
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64.90 EUR
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64.90 EUR
UNE EN 60749-4:2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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46.20 EUR
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46.20 EUR
UNE EN 60749-42:2014
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.)
Released: 2014-11-01
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46.20 EUR
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46.20 EUR
UNE EN 60749-44:2016
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
Released: 2016-12-01
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72.60 EUR
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72.60 EUR
UNE EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Released: 2009-06-01
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83.60 EUR
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83.60 EUR
UNE EN 62779-3:2016
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions (Endorsed by AENOR in July of 2016.)
Released: 2016-07-01
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64.90 EUR
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64.90 EUR
UNE EN IEC 60749-30:2020
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)
Released: 2020-11-01
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70.40 EUR
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70.40 EUR
UNE EN 61975:2010/A2:2022
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in January of 2023.)
Released: 2023-01-01
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50.60 EUR
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50.60 EUR
UNE EN IEC 60749-5:2024
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)
Released: 2024-03-01
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63.80 EUR
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63.80 EUR
UNE EN 60191-6-10:2004
Mechanical standardization of semiconductor devices -- Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON
Released: 2004-05-28
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77.88 EUR
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77.88 EUR
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64.90 EUR
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64.90 EUR
UNE EN 60191-6-2:2003
Mechanical standardization of semiconductor devices -- Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages
Released: 2003-10-10
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76.56 EUR
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76.56 EUR
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63.80 EUR
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63.80 EUR
UNE EN 60191-6-6:2002
Mechanical standardization of semiconductor devices -- Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine pitch land grid array (FLGA).
Released: 2002-03-21
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77.88 EUR
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77.88 EUR
Spanish PDF
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64.90 EUR
Spanish Hardcopy
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64.90 EUR
94 results
First page123457Last page