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Homepage>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices

31.080.99 Other semiconductor devices

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56 results
1345Last page
UNE EN 60747-16-1:2002
Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by AENOR in July of 2002.)
Released: 2002-07-01
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88.00 EUR
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In stock
88.00 EUR
UNE EN 60747-16-4:2004
Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches (Endorsed by AENOR in November of 2004.)
Released: 2004-11-01
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78.10 EUR
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In stock
78.10 EUR
UNE EN IEC 60747-16-6:2019
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)
Released: 2019-10-01
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79.20 EUR
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79.20 EUR
UNE EN IEC 62969-3:2018
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in August of 2018.)
Released: 2018-08-01
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78.10 EUR
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78.10 EUR
UNE EN IEC 62031:2020
LED modules for general lighting - Safety specifications
Released: 2020-06-24
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104.28 EUR
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104.28 EUR
Spanish PDF
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86.90 EUR
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86.90 EUR
UNE EN IEC 60747-17:2020/AC:2021-02
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in March of 2021.)
Released: 2021-03-01
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2.19 EUR
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2.19 EUR
UNE EN 61967-2:2005
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (Endorsed by AENOR in January of 2006.)
Released: 2006-01-01
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74.80 EUR
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In stock
74.80 EUR
UNE EN 62047-16:2015
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films – Wafer curvature and cantilever beam deflection methods (Endorsed by AENOR in August of 2015.)
Released: 2015-08-01
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62.70 EUR
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In stock
62.70 EUR
UNE EN 62047-20:2014
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (Endorsed by AENOR in November of 2014.)
Released: 2014-11-01
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99.00 EUR
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In stock
99.00 EUR
UNE EN 62047-25:2016
Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (Endorsed by Asociación Española de Normalización in January of 2017.)
Released: 2017-01-01
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74.80 EUR
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In stock
74.80 EUR
UNE EN 62047-26:2016
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (Endorsed by AENOR in June of 2016.)
Released: 2016-06-01
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78.10 EUR
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In stock
78.10 EUR
UNE EN 62047-8:2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
Released: 2011-09-01
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70.40 EUR
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70.40 EUR
56 results
1345Last page