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Homepage>ICS codes>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices

31.140 Piezoelectric and dielectric devices

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UNE EN 60444-2:1997
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE IN A PI-NETWORK. PART 2: PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS (Endorsed by AENOR in October of 1997.)
Released: 1997-10-01
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UNE EN 60444-5:1997
MEASUREMENT QUARTZ CRYSTAL UNIT PARAMETERS. PART 5: METHODS FOR THE DETERMINATION OF EQUIVALENT ELECTRICAL PARAMETERS USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION (Endorsed by AENOR in October of 1997.)
Released: 1997-10-01
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UNE EN IEC 63041-1:2021
Piezoelectric sensors - Part 1: Generic specifications (Endorsed by Asociación Española de Normalización in December of 2021.)
Released: 2021-12-01
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UNE EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by Asociación Española de Normalización in November of 2021.)
Released: 2021-11-01
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UNE EN 61338-1-5:2015
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Endorsed by AENOR in October of 2015.)
Released: 2015-10-01
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UNE EN 61338-4-1:2005
Waveguide type dielectric resonators -- Part 4-1: Blank detail specification (Endorsed by AENOR in September of 2005.)
Released: 2005-09-01
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UNE EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (Endorsed by AENOR in October of 2012.)
Released: 2012-10-01
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UNE EN 62276:2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)
Released: 2017-01-01
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UNE EN 61240:2017
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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UNE EN IEC 60122-4:2019
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (Endorsed by Asociación Española de Normalización in May of 2019.)
Released: 2019-05-01
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UNE EN IEC 62884-3:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods (Endorsed by Asociación Española de Normalización in June of 2018.)
Released: 2018-06-01
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UNE EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (Endorsed by Asociación Española de Normalización in August of 2019.)
Released: 2019-08-01
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71 results
First page1356Last page