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Homepage>ICS codes>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices

31.140 Piezoelectric and dielectric devices

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71 results
First page1356Last page
UNE EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (Endorsed by Asociación Española de Normalización in August of 2019.)
Released: 2019-08-01
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75.90 EUR
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75.90 EUR
UNE EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (Endorsed by AENOR in October of 2012.)
Released: 2012-10-01
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74.80 EUR
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74.80 EUR
UNE EN 62276:2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)
Released: 2017-01-01
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83.60 EUR
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83.60 EUR
UNE EN 60679-5:1998
QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5: SECTIONAL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.)
Released: 1998-11-01
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70.40 EUR
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70.40 EUR
UNE EN 61240:2017
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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74.80 EUR
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UNE EN 61338-1-5:2015
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Endorsed by AENOR in October of 2015.)
Released: 2015-10-01
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72.60 EUR
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72.60 EUR
UNE EN 61338-4-1:2005
Waveguide type dielectric resonators -- Part 4-1: Blank detail specification (Endorsed by AENOR in September of 2005.)
Released: 2005-09-01
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41.80 EUR
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41.80 EUR
UNE EN 60368-4-1:2000 CORR:2001
Piezoelectric filters of assessed quality -- Part 4-1: Blank detail specification - Capability approval (Endorsed by AENOR in April of 2001.)
Released: 2001-04-01
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2.19 EUR
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2.19 EUR
UNE EN 60444-4:1997
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK. PART 4 METHOD FOR THE MEASUREMENT OF THE LOAD RESONANCE FREQUENCY FL, LOAD RESONANCE RESISTANCE RL AND THE CALCULATION OF OTHER DERIVED VALUES OF QUARTZ CRYSTAL UNITS, UP TO 30 MHZ. (Endorsed by AENOR in October of 1997.)
Released: 1997-10-01
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68.20 EUR
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68.20 EUR
UNE EN 60444-7:2004
Measurement of queartz crystal unit parameters -- Part 7: Measurement of activity and frequency dips of quartz crystal units (Endorsed by AENOR in September of 2004.)
Released: 2004-09-01
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41.80 EUR
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41.80 EUR
UNE EN 168101:1992
BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPATIBILITY APPROVAL). (Endorsed by AENOR in November of 1997.)
Released: 1997-11-01
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82.50 EUR
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82.50 EUR
UNE EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by Asociación Española de Normalización in November of 2021.)
Released: 2021-11-01
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77.00 EUR
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77.00 EUR
71 results
First page1356Last page