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download between 0-24 hoursReleased: 2000-09-29
IEC 60191-6-3:2000
Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-3: Règles générales pour la préparation des dessins d'encombrement des dispositifs à semiconducteurs à montage en surface - Méthodes de mesure pour les boîtiers plats quadrangulaires (QFP)
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Standard number: | IEC 60191-6-3:2000 |
Released: | 2000-09-29 |
Language: | English/French - Bilingual |
DESCRIPTION
IEC 60191-6-3:2000
IEC 60191-6-3:2000 stipulates a method for quad flat packs (QFP) measuring dimensions which are classified into Form E.