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Homepage>IEC Standards>IEC 60512-25-3:2001 - Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation
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download between 0-24 hoursReleased: 2001-07-26
IEC 60512-25-3:2001 - Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation

IEC 60512-25-3:2001

Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation

Connecteurs pour équipements électroniques - Essais et mesures - Partie 25-3: Essai 25c - Dégradation du temps de montée

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Standard number:IEC 60512-25-3:2001
Released:2001-07-26
Language:English/French - Bilingual
DESCRIPTION

IEC 60512-25-3:2001

Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.

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