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Homepage>IEC Standards>IEC 60512-25-6:2004 - Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
download between 0-24 hoursReleased: 2004-05-26
IEC 60512-25-6:2004 - Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

IEC 60512-25-6:2004

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Connecteurs pour équipements électroniques - Essais et mesures - Partie 25-6: Essai 25f: Diagramme de l'oeil et gigue

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Standard number:IEC 60512-25-6:2004
Released:2004-05-26
Language:English/French - Bilingual
DESCRIPTION

IEC 60512-25-6:2004

Describes methods for measuring an eye pattern response and jitter in the time domain.

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