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Homepage>IEC Standards>IEC 60512-6-2:2002 - Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
download between 0-24 hoursReleased: 2002-02-21
IEC 60512-6-2:2002 - Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

IEC 60512-6-2:2002

Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

Connecteurs pour équipements électroniques - Essais et mesures - Partie 6-2: Essais de contraintes dynamiques - Essai 6b: Secousses

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Standard number:IEC 60512-6-2:2002
Released:2002-02-21
Language:English/French - Bilingual
DESCRIPTION

IEC 60512-6-2:2002

Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.

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