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Homepage>IEC Standards>IEC 60747-5-11:2019 - Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
download between 0-24 hoursReleased: 2019-12-11
IEC 60747-5-11:2019 - Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes

IEC 60747-5-11:2019

Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes

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Standard number:IEC 60747-5-11:2019
Released:2019-12-11
Language:English
DESCRIPTION

IEC 60747-5-11:2019

IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.

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