Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>IEC Standards>IEC 60749-12:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Sponsored link
download between 0-24 hoursReleased: 2017-12-13
IEC 60749-12:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

IEC 60749-12:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12: Vibrations, fréquences variables

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
22.00 EUR
English/French - Bilingual Hardcopy
in stock
22.00 EUR
Standard number:IEC 60749-12:2017
Released:2017-12-13
Language:English/French - Bilingual
DESCRIPTION

IEC 60749-12:2017

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Print