Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>IEC Standards>IEC 60749-31:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Sponsored link
download between 0-24 hoursReleased: 2002-08-30
IEC 60749-31:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

IEC 60749-31:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 31: Inflammabilité des dispositifs à encapsulation plastique (cas d'une cause interne d'inflammation)

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
22.00 EUR
English/French - Bilingual Hardcopy
in stock
22.00 EUR
Standard number:IEC 60749-31:2002
Released:2002-08-30
Language:English/French - Bilingual
DESCRIPTION

IEC 60749-31:2002

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.

Print