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Homepage>IEC Standards>IEC 60749-36:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
download between 0-24 hoursReleased: 2003-02-13
IEC 60749-36:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

IEC 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 36: Accélération constante

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Standard number:IEC 60749-36:2003
Released:2003-02-13
Language:English/French - Bilingual
DESCRIPTION

IEC 60749-36:2003

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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