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Homepage>IEC Standards>IEC 61215-1-3:2021+AMD1:2022 CSV - Terrestrial photovoltaic (PV) modules - Design qualification and type approval - Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic (PV) modules
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download between 0-24 hoursReleased: 2022-03-28
IEC 61215-1-3:2021+AMD1:2022 CSV - Terrestrial photovoltaic (PV) modules - Design qualification and type approval - Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic (PV) modules

IEC 61215-1-3:2021+AMD1:2022 CSV

Terrestrial photovoltaic (PV) modules - Design qualification and type approval - Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic (PV) modules

Modules photovoltaïques (PV) pour applications terrestres - Qualification de la conception et homologation - Partie 1-3: Exigences particulières d'essai des modules photovoltaïques (PV) au silicium amorphe à couches minces

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Standard number:IEC 61215-1-3:2021+AMD1:2022 CSV
Released:2022-03-28
Language:English/French - Bilingual
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IEC 61215-1-3:2021+AMD1:2022 CSV

IEC 61215-1-3:2021+AMD1:2022 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all thin-film amorphous silicon (a-Si; a-Si/µc-Si) based terrestrial flat plate modules. As such, it addresses special requirements for testing of this technology supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing. This second edition cancels and replaces the first edition of IEC 61215-1-3, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition: a. A cyclic (dynamic) mechanical load test (MQT 20) added. b. A test for detection of potential-induced degradation (MQT 21) added. c. A bending test (MQT 22) for flexible modules.