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Homepage>IEC Standards>IEC 61580-9:1996 - Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
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download between 0-24 hoursReleased: 1996-07-03
IEC 61580-9:1996 - Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

IEC 61580-9:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

Méthodes de mesure applicables aux guides d'ondes - Partie 9: Coefficient de réflexion aux interfaces des guides d'ondes

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Standard number:IEC 61580-9:1996
Released:1996-07-03
Language:English/French - Bilingual
DESCRIPTION

IEC 61580-9:1996

Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.

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