Don't have a credit card? Never mind we support BANK TRANSFER .

PRICES include / exclude VAT
Homepage>IEC Standards>IEC 62047-3:2006 - Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
download between 0-24 hoursReleased: 2006-08-15
IEC 62047-3:2006 - Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

IEC 62047-3:2006

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 3: Eprouvette d'essai normalisée en couche mince pour l'essai de traction

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
22.00 EUR
English/French - Bilingual Hardcopy
in stock
22.00 EUR
Standard number:IEC 62047-3:2006
Released:2006-08-15
Language:English/French - Bilingual
DESCRIPTION

IEC 62047-3:2006

Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.