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Homepage>IEC Standards>IEC 62047-7:2011 - Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
download between 0-24 hoursReleased: 2011-06-16
IEC 62047-7:2011 - Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

IEC 62047-7:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 7: Filtre et duplexeur BAW MEMS pour la commande et le choix des fréquences radioélectriques

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Standard number:IEC 62047-7:2011
Released:2011-06-16
Language:English/French - Bilingual
DESCRIPTION

IEC 62047-7:2011

IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.

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