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Homepage>IEC Standards>IEC 62132-2:2010 - Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
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download between 0-24 hoursReleased: 2010-03-30
IEC 62132-2:2010 - Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

IEC 62132-2:2010

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

Circuits intégrés - Mesure de l'immunité electromagnétique - Partie 2: Mesure de l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande

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Standard number:IEC 62132-2:2010
Released:2010-03-30
Language:English/French - Bilingual
DESCRIPTION

IEC 62132-2:2010

IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

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