Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>IEC Standards>IEC 62132-8:2012 - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Sponsored link
download between 0-24 hoursReleased: 2012-07-06
IEC 62132-8:2012 - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

IEC 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 8: Mesure de l'immunité rayonnée - Méthode de la ligne TEM à plaques pour circuit intégré

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
170.50 EUR
English/French - Bilingual Hardcopy
in stock
170.50 EUR
Standard number:IEC 62132-8:2012
Released:2012-07-06
Language:English/French - Bilingual
DESCRIPTION

IEC 62132-8:2012

IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz. This publication is to be read in conjunction with IEC 62132-1:2006.

Print