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Homepage>IEC Standards>IEC 62374:2007 - Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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download between 0-24 hoursReleased: 2007-03-29
IEC 62374:2007 - Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

IEC 62374:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Dispositifs à semiconducteurs - Essai de rupture diélectrique en fonction du temps (TDDB) pour films diélectriques de grille

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Standard number:IEC 62374:2007
Released:2007-03-29
Language:English/French - Bilingual
DESCRIPTION

IEC 62374:2007

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

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