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download between 0-24 hoursReleased: 2010-05-19
IEC 62415:2010
Semiconductor devices - Constant current electromigration test
Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
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English/French - Bilingual PDF
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| Standard number: | IEC 62415:2010 |
| Released: | 2010-05-19 |
| Language: | English/French - Bilingual |
DESCRIPTION
IEC 62415:2010
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.