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Homepage>IEC Standards>IEC 62433-3:2017 - EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
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download between 0-24 hoursReleased: 2017-01-27
IEC 62433-3:2017 - EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

IEC 62433-3:2017

EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

Modèles de circuits intégrés pour la CEM - Partie 3: Modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques - Modélisation des émissions rayonnées (ICEM-RE)

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Standard number:IEC 62433-3:2017
Released:2017-01-27
Language:English/French - Bilingual
DESCRIPTION

IEC 62433-3:2017

IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE.  The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.

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