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Homepage>IEC Standards>IEC 62526:2007 - Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
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download between 0-24 hoursReleased: 2007-11-07
IEC 62526:2007 - Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

IEC 62526:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

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Standard number:IEC 62526:2007
Released:2007-11-07
Language:English
DESCRIPTION

IEC 62526:2007

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.