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download between 0-24 hoursReleased: 2007-11-07
IEC 62526:2007
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
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Standard number: | IEC 62526:2007 |
Released: | 2007-11-07 |
Language: | English |
DESCRIPTION
IEC 62526:2007
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.