PRICES include / exclude VAT
Homepage>IEC Standards>IEC 62779-2:2016 - Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Sponsored link
download between 0-24 hoursReleased: 2016-02-18
IEC 62779-2:2016 - Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances

IEC 62779-2:2016

Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances

Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2: Caractérisation des performances d'interfaçage

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
126.50 EUR
English/French - Bilingual Hardcopy
in stock
126.50 EUR
Standard number:IEC 62779-2:2016
Released:2016-02-18
Language:English/French - Bilingual
DESCRIPTION

IEC 62779-2:2016

IEC 62779-2:2016 defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). In the measurement method, a signal transmitter is electrically isolated from a signal receiver, so an isolation condition between the transmitter and receiver is maintained to accurately measure the electrode's performances. This part includes general and functional specifications of the measurement method.