IEC 63150-1:2019
Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
Dispositifs à semiconducteurs - Méthodes de mesure et d’évaluation des dispositifs de captage d’énergie cinétique dans un environnement de vibrations concret - Partie 1: Vibrations mécaniques arbitraires et aléatoires
| Standard number: | IEC 63150-1:2019 |
| Released: | 2019-05-10 |
| Language: | English/French - Bilingual |
IEC 63150-1:2019
IEC 63150-1:2019 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range. This document is applicable to vibration energy harvesting devices with different power generation principles (such as electromagnetic, piezoelectric, electrostatic, etc.) and with different non-linear behaviour to the external mechanical excitation.