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download between 0-24 hoursReleased: 2017-10-11
IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
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Standard number: | IEC TR 63133:2017 |
Released: | 2017-10-11 |
Language: | English |
DESCRIPTION
IEC TR 63133:2017
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.