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Homepage>IEC Standards>IEC TR 63133:2017 - Semiconductor devices - Scan based ageing level estimation for semiconductor devices
download between 0-24 hoursReleased: 2017-10-11
IEC TR 63133:2017 - Semiconductor devices - Scan based ageing level estimation for semiconductor devices

IEC TR 63133:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

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Standard number:IEC TR 63133:2017
Released:2017-10-11
Language:English
DESCRIPTION

IEC TR 63133:2017

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

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