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Homepage>IEC Standards>IEC TR 63258:2021 - Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films
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download between 0-24 hoursReleased: 2021-03-19
IEC TR 63258:2021 - Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films

IEC TR 63258:2021

Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films

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Standard number:IEC TR 63258:2021
Released:2021-03-19
Language:English
DESCRIPTION

IEC TR 63258:2021

IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data reproducibility.

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