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Homepage>IEC Standards>IEC TS 61945:2000 - Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
download between 0-24 hoursReleased: 2000-03-10
IEC TS 61945:2000 - Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

IEC TS 61945:2000

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

Circuits intégrés - Agrément d'une ligne de fabrication - Méthodologie d'analyse technologique et de défaillance

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English/French - Bilingual PDF
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44.00 EUR
English/French - Bilingual Hardcopy
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Standard number:IEC TS 61945:2000
Released:2000-03-10
Language:English/French - Bilingual
DESCRIPTION

IEC TS 61945:2000

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

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