PRICES include / exclude VAT
Homepage>IEC Standards>IEC TS 62607-6-11:2022 - Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
Sponsored link
download between 0-24 hoursReleased: 2022-02-08
IEC TS 62607-6-11:2022 - Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

IEC TS 62607-6-11:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

Format
Availability
Price and currency
English PDF
Immediate download
209.00 EUR
English Hardcopy
in stock
209.00 EUR
Standard number:IEC TS 62607-6-11:2022
Released:2022-02-08
Language:English
DESCRIPTION

IEC TS 62607-6-11:2022

IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic • defect density nD of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by • Raman spectroscopy