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Homepage>IEC Standards>IEC TS 62878-2-4:2015 - Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
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download between 0-24 hoursReleased: 2015-03-27
IEC TS 62878-2-4:2015 - Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

IEC TS 62878-2-4:2015

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

Substrat avec appareil(s) intégré(s) - Partie 2-4: Directives - Groupes d'éléments d'essai (TEG)

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Standard number:IEC TS 62878-2-4:2015
Released:2015-03-27
Language:English/French - Bilingual
DESCRIPTION

IEC TS 62878-2-4:2015

IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

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