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Released: 27.01.2017
IEEE 1445-2016
IEEE Standard for Digital Test Interchange Format (DTIF)
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83.40 EUR
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Standard number: | IEEE 1445-2016 |
Released: | 27.01.2017 |
ISBN: | 978-1-5044-3691-5 |
Pages: | 64 |
Status: | Active |
Language: | English |
DESCRIPTION
IEEE 1445-2016
This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE).This standard is to be used as the standard definition of DATPG output formats and informational content.
Revision Standard - Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.