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Released: 27.01.2017

IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

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Standard number:IEEE 1445-2016
Released:27.01.2017
ISBN:978-1-5044-3691-5
Pages:64
Status:Active
Language:English
DESCRIPTION

IEEE 1445-2016

This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE).

This standard is to be used as the standard definition of DATPG output formats and informational content.

Revision Standard - Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.