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Homepage>IEEE Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>IEEE 1658-2023 - IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
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Released: 10.12.2024

IEEE 1658-2023 - IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

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Standard number:IEEE 1658-2023
Released:10.12.2024
Released:13.10.2023
ISBN:978-1-5044-9807-4
Pages:115
Status:Active
Language:English
DESCRIPTION

IEEE 1658-2023

This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). Although principally applicable to monolithic, hybrid, module DACs, most of the definitions and test procedures can be applied to systems containing DACs.

This standard is written to clear up confusion relating to the terms and definitions concerning DACs. Test methods are defined with expected output and analysis of the data generated from these test methods. Product specifications are defined in clear terms that will be understandable by all international users and manufacturers.

Revision Standard - Active. Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.