Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>IEEE Standards>35 INFORMATION TECHNOLOGY. OFFICE MACHINES>35.240 Applications of information technology>35.240.30 IT applications in information, documentation and publishing>IEEE 1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
Sponsored link
Released: 26.04.2024

IEEE 1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1

Format
Availability
Price and currency
English PDF
Immediate download
0.00 EUR
Standard number:IEEE 1671.1-2017/Cor 1-2023
Released:26.04.2024
ISBN:979-8-8557-0693-2
Pages:15
Status:Active
Language:English
DESCRIPTION

IEEE 1671.1-2017/Cor 1-2023

This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the life cycle of test program sets (TPSs) that will be used in an automatic test environment.



Corrigendum Standard - Active. Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1671 directory here: https://standards.ieee.org/wp-content/uploads/2024/04/1671.1-2017-cor1-2023-downloads.zip
Print