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Released: 19.03.2018

IEEE 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

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Standard number:IEEE 1671.1-2017
Released:19.03.2018
ISBN:978-1-5044-4631-0
Pages:274
Status:Active
Language:English
DESCRIPTION

IEEE 1671.1-2017

This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the life cycle of test program sets (TPSs) that will be used in an automatic test environment.

No purpose statement is required since this standard is intended for IEC standardization

Revision Standard - Active. An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.